The hottest Siemens made its debut at the 23rd Chi

2022-08-26
  • Detail

Siemens appeared at the 23rd China International measurement control and Instrumentation Exhibition (MICON gently wraps the surface of the object ex 2013)

the 24th China International measurement control and Instrumentation Exhibition will be held in the China International Exhibition Center (old hall) from August 27 to August 30, 2013. As the wind vane of domestic measurement and control, instrumentation and automation industry, China International measurement and control and Instrumentation Exhibition has become a window for the whole industry to gain insight into enterprise trends and overall market fluctuations. It is expected that the exhibition will cover a total area of more than 25000 square meters, with nearly 700 enterprises from around the world participating and 30000 professional visitors

Siemens will appear in booth 8b023 under the slogan of Siemens, your one-stop process instrument solution supplier. Through on-site equipment and exhibition boards, Siemens has introduced its products and solutions for the chemical industry, environmental protection industry, heavy industry, weighing and communication network to experts and visitors in various industries. In addition, Siemens will hold a technical lecture on the first day of the exhibition

during the same period of the exhibition, the fourth arc China is not so familiar with experimental machines. The industrial forum will be held at the Royal Hotel in Beijing on August 29. The focus of the meeting will be on the focus issues of industrial end users, machine manufacturers and automation suppliers in the next five years. Guests of the forum will share forward-looking technologies and practical applications. Qian xiaolun, general manager of the sensor and Communication Department of the industrial automation group in the industrial business field of Siemens (China) Co., Ltd., will share Siemens' ideas with the guests in view of the trends and challenges of the process industry

can be expected

Copyright © 2011 JIN SHI